Stress: General Loading Conditions
Components of Stress
Stress Concentrations in Circular Shafts
Temperature Dependent Deformation
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Updated: Sep 5, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Ying Chang1, Donghui Fu1,2, Mingyuan Sun1
1Department of Mechanics, School of Mechanical Engineering, Tianjin University, Tianjin 300072, China.
Micro Raman spectroscopy struggles to decouple in-plane stress components in monocrystalline silicon (c-Si). High numerical aperture (NA) objective lenses accurately measure stress sums but not individual stress differences, limiting practical applications.
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