Clinical and echocardiographic risk factors for device-related thrombus after left atrial appendage closure: an

Vivian Vij1, Kerstin Piayda2, Dominik Nelles1

  • 1Department of Cardiology, University Hospital Bonn, Venusberg-Campus 1, 53127, Bonn, Germany.

Insights

Device-related Thrombus (DRT) after left atrial appendage closure (LAAC) is linked to adverse events. Key risk factors include patient history of stroke/TIA, spontaneous echocardiographic contrast, and device implantation depth.

Area of Science:

  • Cardiology
  • Medical Devices
  • Thrombosis

Background:

  • Device-related Thrombus (DRT) following left atrial appendage closure (LAAC) is not well-documented.
  • Limited data exists on risk factors for DRT post-LAAC.

Purpose of the Study:

  • To investigate the risk factors associated with Device-related Thrombus (DRT) after left atrial appendage closure (LAAC).
  • To identify patient and procedural characteristics that predict DRT development.

Main Methods:

  • Analysis of 537 patients undergoing LAAC, comparing 112 with DRT to 425 without.
  • Inclusion of baseline, implantation characteristics, anti-thrombotic treatment, and outcomes.
  • Utilized univariate, multivariate, and propensity-score matching (PSM) analyses.

Main Results:

  • DRT patients had higher rates of prior stroke/TIA, spontaneous echocardiographic contrast (SEC), and lower LAA peak emptying velocity.
  • Larger occluders, deeper implantation, and less ostium coverage were observed in DRT patients.
  • Independent risk factors identified: age, prior stroke/TIA, SEC; PSM highlighted implantation depth. DRT patients experienced higher stroke/TIA rates.

Conclusions:

  • Device-related Thrombus (DRT) after LAAC is associated with poor clinical outcomes.
  • DRT appears multifactorial, influenced by patient characteristics, anticoagulation, and device placement.
  • Identifying and mitigating these risk factors is crucial for improving LAAC safety and efficacy.
Abstract