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Surface Morphology of Textured Transparent Conductive Oxide Thin Film Seen by Various Probes: Visible Light, X-rays,

Krunoslav Juraić1, Pavo Dubček1, Mario Bohač1

  • 1Ruđer Bošković Institute, Bijenička Cesta 54, 10000 Zagreb, Croatia.

Materials (Basel, Switzerland)
|July 27, 2022
PubMed

Keywords:
AFMGISAXSTEMUV-Vis-NIR light scatteringfractal dimensionhaze ratioroughnesssurface morphologysurface texturethin filmstin oxide

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