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Diffraction Enhanced Imaging Analysis with Pseudo-Voigt Fit Function.

Deepak Mani^1,2,3, Andreas Kupsch¹, Bernd R Müller¹

¹Bundesanstalt für Materialforschung und -Prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany.

Journal of Imaging

|July 27, 2022

Summary

This summary is machine-generated.

Diffraction enhanced imaging (DEI) uses X-ray refraction for advanced imaging. This study found the Pseudo-Voigt function best fits rocking curves, improving image quality and material property analysis.

Keywords:

Pseudo-Voigt fit function Python X-ray refraction analyzer-based imaging diffraction enhanced imaging non-destructive evaluation

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Area of Science:

Medical physics
Materials science
Digital radiography

Background:

Diffraction enhanced imaging (DEI) is an advanced radiographic technique.
DEI utilizes X-ray refraction to visualize internal material interfaces.
Understanding rocking curves (RCs) is crucial for DEI image quality.

Purpose of the Study:

To evaluate DEI image quality qualitatively and quantitatively.
To assess the impact of different fitting functions on rocking curves (RCs).
To develop a robust algorithm for extracting material properties from DEI images.

Main Methods:

Acquisition of RCs for each image pixel.
Application and comparison of various fitting functions to RCs.
Development of a Python-based algorithm for data analysis.
Testing the algorithm on silicone gel and polycarbonate specimens.

Main Results:

The Pseudo-Voigt (PsdV) function demonstrated superior performance in fitting RCs.
The developed algorithm reliably extracts absorption and refraction properties.
Position-sensitive determination of material properties is achievable.
Successful demonstration on diverse specimen types.

Conclusions:

The Pseudo-Voigt function is optimal for analyzing DEI rocking curves.
A robust algorithm enhances the quantitative analysis of DEI data.
DEI offers valuable insights into material interfaces and properties.
This technique shows promise for characterizing various materials.