Phenotyping Complex Plant Structures with a Large Format Industrial Scale High-Resolution X-Ray Tomography Instrument

Phenotyping specific plant traits is difficult when the samples to be measured are architecturally complex. Inflorescence and root system traits are of great biological interest, but these structures present unique phenotyping challenges due to their often complicated and three-dimensional (3D) forms. We describe how a large industrial scale X-ray tomography (XRT) instrument can be used to scan architecturally complex plant structures for the goal of rapid and accurate measurement of traits that are otherwise cumbersome or not possible to capture by other means. The combination of a large imaging cabinet that can accommodate a wide range of sample size geometries and a variable microfocus reflection X-ray source allows noninvasive X-ray imaging and 3D volume generation of diverse sample types. Specific sample fixturing (mounting) and scanning conditions are presented. These techniques can be moderate to high throughput and still provide unprecedented levels of accuracy and information content in the 3D volume data they generate.