Position-Sensitive Bulk and Surface Element Analysis of Decorated Porcelain Artifacts

Area of Science:

• Materials Science
• Archaeometry
• Analytical Chemistry

Background:

• Decorated porcelain artifacts require multi-technique analysis for comprehensive characterization.
• Understanding both surface decoration and bulk composition is crucial for historical and material insights.

Purpose of the Study:

• To develop and apply a non-destructive analytical strategy for decorated porcelain.
• To investigate the combined potential of surface and bulk analytical techniques for ceramic studies.

Main Methods:

• Utilized position-sensitive X-ray Fluorescence Spectrometry (XRF) for surface analysis.
• Employed Prompt-gamma activation analysis (PGAA) for bulk elemental composition.
• Assisted analysis with 3D structured-light optical scanning and dual-energy X-ray radiography.

Main Results:

• Successfully characterized both decorative elements and bulk composition non-destructively.
• Demonstrated the synergistic value of integrating near-surface and bulk chemical data.
• Provided a foundation for understanding raw material sourcing and manufacturing processes.

Conclusions:

• The combined use of XRF and PGAA, supported by optical and radiographic methods, offers a powerful approach for ceramic artifact analysis.
• This integrated methodology enhances the understanding of historical ceramic production technologies.
• Non-destructive characterization is key to preserving and studying valuable cultural heritage objects.