Thickness profiling of electron transparent aluminium alloy foil using convergent beam electron diffraction
Artenis Bendo1, Masoud Moshtaghi2, Matthew Smith1
1School of Materials, University of Manchester, Manchester, UK.
Journal of Microscopy
|August 2, 2022
Summary
Convergent beam electron diffraction (CBED) accurately measured aluminum alloy foil thickness. This method is crucial for precise material characterization in nanotechnology and materials science.
Area of Science:
- Materials Science
- Condensed Matter Physics
Background:
- Accurate thickness profiling of thin foils is essential for materials characterization.
- Twin-jet electropolishing is a common method for preparing electron microscopy samples.
Purpose of the Study:
- To profile the thickness of aluminum alloy foils.
- To validate the use of Convergent Beam Electron Diffraction (CBED) for thickness measurements.
Main Methods:
- Utilized Convergent Beam Electron Diffraction (CBED).
- Employed twin-jet electropolishing for sample preparation.
- Analyzed Kossel-Möllenstedt (K-M) fringes for thickness determination.
Main Results:
- Successfully profiled aluminum alloy foil thickness using CBED.
- Thickness was determined by matching experimental and simulated diffraction patterns for single K-M fringes.
- Linear regression fitting was used for areas with multiple K-M fringes.
Conclusions:
- CBED is an effective technique for determining the thickness of aluminum alloy foils.
- The method provides accurate thickness profiles across varying distances from the sample edge.
