Overview of Microscopy Techniques
Atomic Force Microscopy
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Updated: Sep 2, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
Hsuan-Wei Liu1,2, Michael A Becker1, Korenobu Matsuzaki1
1Max Planck Institute for the Science of Light, D-91058 Erlangen, Germany.
A novel device overcomes scanning probe microscopy instability by rolling substrates, enabling precise positioning of nanoparticles and quantum dots for enhanced fluorescence. This method ensures stable nanoscopic feature placement for over an hour.
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