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Related Concept Videos

X-ray Crystallography02:18

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The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
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Precise wavefront characterization of x-ray optical elements using a laboratory source.

J Lukas Dresselhaus1, Holger Fleckenstein2, Martin Domaracký2

  • 1The Hamburg Centre for Ultrafast Imaging, Luruper Chaussee 149, 22761 Hamburg, Germany.

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|August 3, 2022
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Summary
This summary is machine-generated.

A new laboratory setup enables precise characterization of x-ray optics using lab-based micro-sources. This method matches synchrotron performance, accelerating the development of advanced optical elements like multilayer Laue lenses.

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Area of Science:

  • X-ray optics and metrology
  • Advanced materials characterization

Background:

  • Accurate measurement of x-ray optical performance is crucial for advancements in optics fabrication and aberration correction.
  • Current characterization relies on synchrotron sources, limiting development due to access constraints.

Purpose of the Study:

  • To present a laboratory setup for high-precision characterization of x-ray optics using lab-based micro-sources.
  • To demonstrate the capability of this setup for routine analysis of optical elements, including multilayer Laue lenses.

Main Methods:

  • Development and implementation of a laboratory setup utilizing a commercially available x-ray micro-source.
  • Application of ptychographic x-ray speckle tracking for precise metrology.
  • Characterization of wavefront distortions, optimal photon energy, and focal length of optical elements.

Main Results:

  • The laboratory setup achieves precision and sensitivity comparable to synchrotron-based measurements.
  • Routine characterization of high numerical aperture multilayer Laue lenses and other optical elements was successfully performed.
  • Phase errors of a multilayer Laue lens were corrected using a 3D printed compound refractive phase plate, demonstrating feedback from measurements.

Conclusions:

  • Lab-based characterization of x-ray optics is now feasible with high precision, overcoming synchrotron access limitations.
  • The developed setup accelerates the development cycle for advanced x-ray optical components.
  • This approach facilitates the design and implementation of corrective measures for optical aberrations.