Electronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions

Area of Science:

• Materials Science
• Condensed Matter Physics
• Nanotechnology

Background:

• Electronic gaps are crucial for material electric and optical properties.
• Existing characterization techniques face challenges at the nanoscale and under ambient conditions.

Purpose of the Study:

• To develop a novel scanning probe microscopy technique for nanoscale electronic gap characterization.
• To enable measurements at room temperature and ambient pressure.

Main Methods:

• Utilizing a scanning probe microscope to probe the electronic gap.
• Monitoring local quantum capacitance changes via Coulomb force at a mesoscopic scale.

Main Results:

• Successfully characterized the electronic gap with nanometre resolution.
• Demonstrated the technique's efficacy on 2D semiconductors and van der Waals heterostructures.
• Achieved measurements under ambient conditions.

Conclusions:

• The developed technique offers a viable method for nanoscale electronic gap measurement.
• This advancement facilitates the study of electronic properties of materials under ambient conditions.