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Updated: Sep 2, 2025

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
Leveraging negative capacitance ferroelectric materials for performance boosting of sub-10 nm graphene nanoribbon
Khalil Tamersit1,2,3, Mohammad Hossein Moaiyeri4,5, Mohammad Khaleqi Qaleh Jooq4
1Department of Electronics and Telecommunications, Université 8 Mai 1945 Guelma, Guelma 24000, Algeria.
Abstract:
In this paper, an ultrascaled ballistic graphene nanoribbon field-effect transistor (GNRFET) endowed with a compound double-gate based on metal-ferroelectric-metal (MFM) structure is proposed to overcome the limitations encountered with its conventional counterpart. The ballistic transistor is computationally investigated by solving self-consistently the non-equilibrium Green's function formalism and the Poisson solver in conjunction with the Landau-Khalatnikov equation. The numerical investigation has included the ferroelectric-induced amplified internal metal voltage, the role of the ferroelectric thickness in boosting the device performance, the assessment of the switching and subthreshold performance, and the analysis of the FE-GNRFET scaling capability. The simulations revealed that the MFM-based gate can significantly boost the performance of GNRFETs, including the switching behavior, the on-current, the off-current, the current ratio, the swing factor, the intrinsic delay, and the scaling capability. More importantly, the proposed MFM GNRFET was found able to provide sub-thermionic subthreshold swing even with sub-10 nm gate lengths, which is very promising for low-power applications. The obtained results indicate that the MFM-based gating approach can give new impulses to the GNRFET technology.
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