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Updated: Sep 1, 2025

11:14
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
13.9K
The defect challenge of wide-bandgap semiconductors for photovoltaics and beyond
Alex M Ganose1, David O Scanlon2,3, Aron Walsh1
1Department of Materials, Imperial College London, Exhibition Road, London, SW7 2AZ, UK.
Nature Communications
|August 11, 2022
Abstract
No abstract available in PubMed .
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