Hyperelastic Microcantilever AFM: Efficient Detection Mechanism Based on Principal Parametric Resonance

The impetus of writing this paper is to propose an efficient detection mechanism to scan the surface profile of a micro-sample using cantilever-based atomic force microscopy (AFM), operating in non-contact mode. In order to implement this scheme, the principal parametric resonance characteristics of the resonator are employed, benefiting from the bifurcation-based sensing mechanism. It is assumed that the microcantilever is made from a hyperelastic material, providing large deformation under small excitation amplitude. A nonlinear strain energy function is proposed to capture the elastic energy stored in the flexible component of the device. The tip-sample interaction is modeled based on the van der Waals non-contact force. The nonlinear equation governing the AFM's dynamics is established using the extended Hamilton's principle, obeying the Euler-Bernoulli beam theory. As a result, the vibration behavior of the system is introduced by a nonlinear equation having a time-dependent boundary condition. To capture the steady-state numerical response of the system, a developed Galerkin method is utilized to discretize the partial differential equation to a set of nonlinear ordinary differential equations (ODE) that are solved by the combination of shooting and arc-length continuation method. The output reveals that while the resonator is set to be operating near twice the fundamental natural frequency, the response amplitude undergoes a significant drop to the trivial stable branch as the sample's profile experiences depression in the order of the picometer. According to the performed sensitivity analysis, the proposed working principle based on principal parametric resonance is recommended to design AFMs with ultra-high detection resolution for surface profile scanning.