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Updated: Sep 1, 2025

The Diffusion of Passive Tracers in Laminar Shear Flow
Published on: May 1, 2018
Interface collisions with diffusive mass transport
Bastien Marguet1, F D A Aarão Reis2, Olivier Pierre-Louis1
1Institut Lumière Matière, UMR5306 Université Lyon 1-CNRS, Université de Lyon, 69622 Villeurbanne, France.
Abstract:
We report on a linear Langevin model that describes the evolution of the roughness of two interfaces that move towards each other and are coupled by a diffusion field. This model aims at describing the closing of the gap between two 2D material domains during growth, and the subsequent formation of a rough grain boundary. We assume that deposition occurs in the gap between the two domains and that the growth units diffuse and may attach to the edges of the domains. These units can also detach from edges, diffuse, and reattach elsewhere. For slow growth, the edge roughness increases monotonously and then saturates at some equilibrium value. For fast growth, the roughness exhibits a maximum just before the collision between the two interfaces, which is followed by a minimum. The peak of the roughness can be dominated by statistical fluctuations or by edge instabilities. A phase diagram with three regimes is obtained: Slow growth without peak, peak dominated by statistical fluctuations, and peak dominated by instabilities. These results reproduce the main features observed in kinetic Monte Carlo simulations.
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