Spectral calibration of photon-counting detectors at high photon flux

Calibration of photon-counting detectors (PCDs) is necessary for quantitatively accurate spectral computed tomography (CT), but the calibration process can be complicated by nonlinear flux-dependent physical factors such as pulse pile-up.

This work develops a method for spectral sensitivity calibration of a PCD-based spectral CT system that incorporates nonlinear flux dependence and can thus be employed at high photon flux.

A calibration model for the spectral response and polynomial flux dependence is proposed, which incorporates prior x-ray source spectrum and PCD models and that has a small set of parameters for adjusting to the spectral CT system of interest. The model parameters are determined by fitting transmission data from a known object of known composition: a step-wedge phantom composed of different thicknesses of aluminum, a bone equivalent, and polymethyl methacrylate (PMMA), a soft-tissue equivalent. This fitting employs Tikhonov regularization, and the regularization strength and the polynomial order for the intensity modeling are determined by bias and variance analysis. The spectral calibration and nonlinear intensity correction is validated on transmission measurements through a third material, Teflon, at different x-ray photon flux levels.

The nonlinear intensity dependence is determined to be accurately accounted for with a third-order polynomial. The calibrated spectral CT model accurately predicts Teflon transmission to within 1% for flux levels up to 50% of the detector maximum.

The proposed PCD calibration method enables accurate physical modeling necessary for quantitative imaging in spectral CT. Furthermore, the model applies to high flux settings so that acquisition times will not be limited by restricting the spectral CT system to low flux levels.