Characterization of a Modulated X-ray Source for Ion Mobility Spectrometry

Tobias Reinecke1, Steven Kenyon2, Keith Gendreau1

  • 1Department of Chemistry, Washington State University, Pullman, Washington 99164, United States.

Analytical Chemistry
|August 24, 2022
PubMed
Summary

This study introduces a novel ion mobility spectrometry (IMS) system using a modulated X-ray source (MXS) for ion generation and gating. This shutterless approach eliminates physical ion gates, improving sensitivity and enabling significant signal-to-noise ratio enhancements.

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