Spectrophotometry: Introduction
UV–Vis Spectroscopy: Beer–Lambert Law
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
UV–Vis Spectrometers
UV–Vis Spectroscopy: Woodward–Fieser Rules
Atomic Emission Spectroscopy: Lab
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Updated: Aug 31, 2025

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Ronald P White1, Dragos Buculei2, Alexia M J M Beale2
1Department of Chemistry, Dartmouth College, Hanover, New Hampshire, 03755, USA. jane.e.g.lipson@dartmouth.edu.
Spectroscopic ellipsometry accurately measures the thermal expansion coefficient (α) in polymers using minimal sample. This optical technique advances thermodynamic characterization and material property prediction.
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