A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

Area of Science:

• Electromagnetics and Wave Propagation
• Materials Science and Engineering
• Microwave Engineering

Background:

• Material characterization in the millimeter-wave range traditionally requires significant sample volumes.
• Accurate measurement of S-parameters is crucial for understanding material properties at high frequencies.
• Dielectric waveguides offer unique properties for guiding electromagnetic waves.

Purpose of the Study:

• To develop and validate a measurement system for material characterization using minimal sample material in the millimeter-wave range.
• To enable complete S-parameter measurement with a single-port system.
• To implement and assess algorithms for permittivity determination.

Main Methods:

• Utilized a dielectric waveguide for electromagnetic wave propagation.
• Developed a single-port measurement setup for S-parameter acquisition.
• Implemented and applied two distinct algorithms for calculating material permittivity.
• Extended and optimized an existing waveguide system for enhanced performance.

Main Results:

• Successfully demonstrated a measurement system capable of material characterization with extremely small sample amounts.
• Achieved complete S-parameter measurement using a single-port dielectric waveguide setup.
• Validated the implemented algorithms for permittivity determination through experimental measurements.
• Compared the performance of the new setup against existing measurement techniques.

Conclusions:

• The presented measurement system effectively characterizes materials in the millimeter-wave range using minimal sample volumes.
• The single-port dielectric waveguide approach simplifies S-parameter measurement and material analysis.
• The developed algorithms provide accurate permittivity determination, offering a valuable tool for material science research.