A Compact Measurement Setup for Material Characterization in W-Band Based on Dielectric Waveguides

In this contribution, we present a measurement system for material characterization in the millimeter-wave range that requires extremely small amounts of sample material. With the help of a dielectric waveguide, it is possible to measure the complete S-parameters with only one port. Fundamentals regarding dielectric waveguides and algorithms are explained, which form the basis of the measurement system. Within the scope of this work, an existing waveguide system was extended and optimized. In addition, two algorithms were implemented to determine permittivity. Finally, measurements were carried out to prove the function of the measurement setup and compared to existing measurement setups.