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Updated: Aug 30, 2025

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Thomson scattering on the large plasma device
S Ghazaryan1, M Kaloyan1, W Gekelman1
1Department of Physics and Astronomy, University of California Los Angeles, Los Angeles, California 90095, USA.
Abstract:
We have developed a non-collective Thomson scattering diagnostic for measurements of electron density and temperature on the Large Plasma Device. A triple grating spectrometer with a tunable notch filter is used to discriminate the faint scattering signal from the stray light. In this paper, we describe the diagnostic and its calibration via Raman scattering and present the first measurements performed with the fully commissioned system. Depending on the discharge conditions, the measured densities and temperatures range from 4.0 × 1012 to 2.8 × 1013 cm-3 and from 1.2 to 6.8 eV, respectively. The variation of the measurement error with plasma parameters and discharges averaged is also discussed.
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