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Towards Augmented Microscopy with Reinforcement Learning-Enhanced Workflows.

Michael Xu1, Abinash Kumar1, James M LeBeau1

  • 1Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, USA.

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Summary
This summary is machine-generated.

Reinforcement learning (RL) automates scanning transmission electron microscopy (STEM) beam alignment. A virtual environment and successful microscope deployment show RL

Keywords:
automated microscopyreinforcement learningscanning transmission electron microscopy

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Area of Science:

  • Materials Science
  • Microscopy
  • Artificial Intelligence

Background:

  • Automating complex microscopy workflows is crucial for efficiency.
  • Scanning transmission electron microscopy (STEM) requires precise beam alignment.
  • Current alignment methods can be time-consuming and require expert knowledge.

Purpose of the Study:

  • To implement and evaluate reinforcement learning (RL) for automating STEM operations.
  • To develop an RL agent for autonomous electron beam alignment without prior knowledge.
  • To assess the impact of virtual environment design on RL performance.

Main Methods:

  • Designed a virtual, prototypical RL environment for STEM beam alignment.
  • Developed and trained a neural network using RL within the simulator.
  • Evaluated alignment accuracy and convergence across various hyperparameters.
  • Deployed the trained RL model on an actual STEM microscope.

Main Results:

  • Demonstrated robust convergence of the RL model across a wide hyperparameter space in simulation.
  • The on-microscope RL model achieved goal alignment with minimal training.
  • Validated the effectiveness of the virtual environment design for real-world deployment.
  • Confirmed that RL can automate beam alignment without extensive algorithm design.

Conclusions:

  • Reinforcement learning offers a viable method for automating STEM operations.
  • Virtual environment simulation is key to successful RL implementation in microscopy.
  • This approach advances the integration of machine learning in electron microscopy.