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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Aug 28, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy

Published on: March 16, 2020

Correction to Electrostatic Discovery Atomic Force Microscopy

Niko Oinonen¹, Chen Xu¹, Benjamin Alldritt¹

¹Department of Applied Physics, Aalto University, 00076 Aalto, Espoo, Finland.

|September 14, 2022

Summary

No abstract available in PubMed .

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