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Computationally Efficient Handling of Partially Coherent Electron Sources in (S)TEM Image Simulations via Matrix

Zhongbo Li1, Harald Rose1, Jacob Madsen2

  • 1Electron Microscopy Group of Materials Science, University of Ulm, Ulm 89081, Germany.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|September 14, 2022
PubMed
Summary
This summary is machine-generated.

We present a new method using matrix diagonalization of the mixed envelope function (MEF) to speed up electron microscope image simulations. This approach significantly reduces computation time for simulating partially coherent images in scanning/transmission electron microscopy (S/TEM).

Keywords:
STEM image simulationTEM image simulationmatrix diagonalizationmixed envelope functionpartially coherent sourcetransmission cross-coefficient

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Area of Science:

  • Materials Science
  • Physics
  • Computational Science

Background:

  • Simulating images in scanning/transmission electron microscopy (S/TEM) is computationally intensive.
  • The mixed envelope function (MEF) is crucial for modeling partially coherent electron waves but is computationally demanding due to its 4D array structure.

Purpose of the Study:

  • To develop a computationally efficient method for S/TEM image simulation.
  • To reduce the time required for calculating partially coherent images by optimizing the use of the MEF.

Main Methods:

  • Introduced matrix diagonalization of the mixed envelope function (MEF).
  • Incorporated the electron source's finite size and energy spread into the MEF.
  • Utilized eigenvectors and eigenvalues of the MEF for faster image calculations.
  • Integrated the aperture function within the matrix diagonalization process.

Main Results:

  • Achieved significant reduction in computation time for S/TEM image simulations.
  • High accuracy was maintained by using a small number of eigenvectors.
  • Enabled efficient calculation of partially coherent images by summing weighted coherent images.

Conclusions:

  • Matrix diagonalization of the MEF offers a substantial improvement in computational efficiency for S/TEM image simulation.
  • The method accurately models partially coherent electron beams, leading to faster and reliable image generation.
  • This technique is valuable for advancing computational microscopy and materials characterization.