Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

8.5K
Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
8.5K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Proposal of a Novel Standard for Determining the Aging Period of High-Temperature Daqu Based on the Species-Level Bacterial Composition Through PacBio Sequencing.

Indian journal of microbiology·2026
Same author

Lifetime prediction model for third-harmonic antireflection under high-repetition-rate multipulse laser irradiation.

Optics express·2026
Same author

Mid-infrared nonlinear optical modulation of CdO nanogratings enabled by geometric quantum interference enhancement.

Optics express·2026
Same author

Rotating varifocal hyperspectral imaging system design method based on regularization band energy distribution.

Applied optics·2026
Same author

Interferogram-free adaptive wavefront interferometry: fourier spot analysis enhancing adaptive compensation performance.

Optics express·2026
Same author

Spectral-Integrated Thermal Absorption Model for Broadband Laser-Protective Reflectors Under Supercontinuum Irradiation.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2026

Related Experiment Video

Updated: Aug 28, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

10.4K

Wavefront-coded phase measuring deflectometry for the all-focused measurement.

Zhenqi Niu, Junhua Wang, Yuhan Tian

    Optics Letters
    |September 15, 2022
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces wavefront coding to phase measuring deflectometry, enhancing optical surface measurement accuracy by overcoming depth-of-field limitations. The new method significantly improves measurement precision for complex surfaces, even when images are out of focus.

    More Related Videos

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    9.7K
    Quantitative Optical Microscopy: Measurement of Cellular Biophysical Features with a Standard Optical Microscope
    14:09

    Quantitative Optical Microscopy: Measurement of Cellular Biophysical Features with a Standard Optical Microscope

    Published on: April 7, 2014

    15.7K

    Related Experiment Videos

    Last Updated: Aug 28, 2025

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
    10:28

    Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

    Published on: July 5, 2016

    10.4K
    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    9.7K
    Quantitative Optical Microscopy: Measurement of Cellular Biophysical Features with a Standard Optical Microscope
    14:09

    Quantitative Optical Microscopy: Measurement of Cellular Biophysical Features with a Standard Optical Microscope

    Published on: April 7, 2014

    15.7K

    Area of Science:

    • Optical Engineering
    • Metrology
    • Surface Characterization

    Background:

    • Phase measuring deflectometry (PMD) is crucial for complex optical surface metrology.
    • Limited camera depth of field causes focus issues, leading to position-angle uncertainty and reduced accuracy in PMD.
    • Defocus and other aberrations degrade the quality of captured fringe images, complicating surface reconstruction.

    Purpose of the Study:

    • To develop a PMD technique robust to defocus and low-order aberrations.
    • To enhance measurement accuracy for complex optical surfaces.
    • To reduce the stringent focusing requirements in PMD systems.

    Main Methods:

    • Wavefront coding was employed to modulate the imaging wavefront in the deflectometry system.
    • The modulated point spread function was used to deconvolve captured fringe images, correcting for phase errors.
    • The enhanced PMD system was tested on a highly curved spherical surface.

    Main Results:

    • The wavefront coding technique rendered the measurement system insensitive to defocus and aberrations like astigmatism and field curvature.
    • Image deconvolution using the modulated point spread function effectively reduced phase errors.
    • Measurement accuracy for a highly curved spherical surface was improved by a factor of four.

    Conclusions:

    • The proposed wavefront coding method significantly enhances the robustness and accuracy of phase measuring deflectometry.
    • This technique alleviates the critical focusing requirements, enabling reliable measurement of complex optical surfaces even with defocused images.
    • The findings demonstrate a substantial improvement in measurement precision and applicability for advanced optical metrology.