You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Aug 28, 2025

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
This study introduces wavefront coding to phase measuring deflectometry, enhancing optical surface measurement accuracy by overcoming depth-of-field limitations. The new method significantly improves measurement precision for complex surfaces, even when images are out of focus.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: