Diode: Reverse bias
Schottky Barrier Diode
Diode: Forward bias
MOS Capacitor
Ferromagnetism
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Updated: Aug 28, 2025

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
Xiwen Liu1, John Ting1, Yunfei He1
1Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.
This study introduces a transistor-free compute-in-memory (CIM) architecture using Aluminum Scandium Nitride ferroelectric diodes (FeDs). These FeDs enable efficient data storage, search, and neural network operations, overcoming performance-flexibility trade-offs in CIM.
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