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Device simulations now incorporate amorphous active regions, defects, and interfaces. Molecular dynamics and quantum transport modeling reveal critical electro-thermal effects in conductive bridging random access memories (CBRAM).

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Area of Science:

  • Materials Science
  • Computational Physics
  • Device Engineering

Background:

  • Emergence of novel atomic systems with amorphous active regions necessitates advanced device simulation strategies.
  • Disordered phases, defects, and interfaces significantly impact device performance, requiring sophisticated physical models.
  • Conductive bridging random access memories (CBRAM) are a key area where these challenges are prominent.

Purpose of the Study:

  • To review and present a combined molecular dynamics and quantum transport approach for simulating devices with amorphous active regions.
  • To investigate the critical role of electro-thermal effects in the performance of devices like CBRAM.
  • To demonstrate a modeling methodology based on density functional theory and non-equilibrium Green's function formalism.

Main Methods:

  • Combining molecular dynamics and quantum transport simulations.
  • Utilizing density functional theory (DFT) for electronic structure calculations.
  • Applying the non-equilibrium Green's function (NEGF) formalism to model quantum transport and electro-thermal effects.

Main Results:

  • The proposed modeling approach accurately describes electro-thermal effects in CBRAM devices.
  • Demonstrated the functionality of the DFT-NEGF method across three distinct CBRAM configurations.
  • Highlighted the importance of accounting for amorphous phases, defects, and interfaces in device simulations.

Conclusions:

  • The integrated molecular dynamics and quantum transport approach provides accurate insights into CBRAM performance.
  • Electro-thermal effects are crucial and can be effectively modeled using DFT-NEGF.
  • This methodology advances the simulation of novel atomic systems with complex active regions.