Atomic Emission Spectroscopy: Lab
Scanning Electron Microscopy
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Updated: Aug 28, 2025

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on: July 17, 2015
Shuai Tang1, Jie Tang1,2, Jun Uzuhashi1
1National Institute for Materials Science Tsukuba Ibaraki 305-0047 Japan tang.jie@nims.go.jp.
Researchers developed a new lanthanum hexaboride (LaB6) nanoneedle electron source. This advanced material offers superior stability and reduced energy spread for electron microscopes, surpassing current tungsten filaments.
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