Related Experiment Video
Updated: Aug 12, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
"Metrology is a key component of the industrial value-added chain": an interview with Prof. Wolfgang Osten
1Light Publishing Group, Changchun Institute of Optics, Fine Mechanics, and Physics, Chinese Academy of Sciences, 3888 Dong Nan Hu Road, 130033, Changchun, China. dingshuai@ciomp.ac.cn.
Editorial:
Mendeleev said: "Science begins where one begins to measure," and "exact science is unthinkable without measure." During his more than 4-decades-long career, Prof. Wolfgang Osten has been devoted to optical metrology and inspection technologies. Osten and his research team developed the first automated system for the quantitative and qualitative evaluation of interferograms in the '80s, as well as the principle of tilted-wave interferometry for high-precision aspherical and free-form surface measurement. Both techniques have since been commercialized. His achievements have "lit the way" for research in optical metrology. The bond between Osten and Light Publishing Group can be traced back to 2012, when he first submitted a paper to Light: Science & Applications (LSA) as an author and published a paper1. Right after that, he was invited to join the Editorial Board for his enthusiasm. In 2019, he started the challenge of founding the new journal Light: Advanced Manufacturing (LAM) as the co-Editor-in-Chief. In this interview, Osten shared his insights on Optical Metrology, Holography, and the Founding of LAM with us. Follow the Q&As below and let us get closer to the "Holoknight".
Related Concept Videos
Uncertainty in Measurement: Accuracy and Precision
Uncertainty in Measurement: Reading Instruments
Bearings: Problem Solving
Design of Transmission Shafts
Transmission Shafts: Problem Solving
Next, use bending moment diagrams for the shaft to...
Mechanical Characteristics of Steel
The tension test is fundamental for determining tensile strength. In this test, a steel specimen is stretched using a gripping device until it breaks. The data collected during this test are used to...

