Characterization of Flexible Amorphous Silicon Thin-Film Transistor-Based Detectors with Positive-Intrinsic-Negative

Bongju Han1, Minji Park2,3, Kyuseok Kim4

  • 1Quality Assurance Team, Business Division, Vieworks, 41-3, Burim-ro 170beon-gil, Dongan-gu, Anyang-si 14055, Korea.

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