Related Experiment Video

Updated: Aug 27, 2025

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
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Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures

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Origin of spurious intensity in vacuum near sample edge in bright field TEM images

Misa Hayashida1, Marek Malac2, Jun Yamasaki3

  • 1NRC-NANO, National Research Council, Edmonton, Alberta T6G 2M9, Canada.

Micron (Oxford, England : 1993)
|September 30, 2022
PubMed

Keywords:
Bright field TEMPlural scatteringQuantitative transmission electron microscopy (TEM)Sample thickness in TEMStobbs factor

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