Related Experiment Video
Updated: Aug 27, 2025

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission
Annick De Backer1,2, Zezhong Zhang1,2, Karel H W van den Bos1,2
1EMAT, University of Antwerp, 2020, Antwerp, Belgium.
Abstract:
A new methodology is presented to count the number of atoms in multimetallic nanocrystals by combining energy dispersive X-ray spectroscopy (EDX) and high angle annular dark field scanning transmission electron microscopy (HAADF STEM). For this purpose, the existence of a linear relationship between the incoherent HAADF STEM and EDX images is exploited. Next to the number of atoms for each element in the atomic columns, the method also allows quantification of the error in the obtained number of atoms, which is of importance given the noisy nature of the acquired EDX signals. Using experimental images of an Au@Ag core-shell nanorod, it is demonstrated that 3D structural information can be extracted at the atomic scale. Furthermore, simulated data of an Au@Pt core-shell nanorod show the prospect to characterize heterogeneous nanostructures with adjacent atomic numbers.
Related Concept Videos
Atomic Emission Spectroscopy: Overview
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
Atomic Emission Spectroscopy: Lab
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Atomic Emission Spectroscopy: Instrumentation
Atomic Absorption Spectroscopy: Atomization Methods

