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Interpreting x̄ charts, a type of control chart used in statistical process control helps monitor the variation in processes over time. The x̄ chart is based on the sample mean and allows for monitoring variations in the process mean over time. These charts are pivotal for quality assurance in manufacturing and other sectors.
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Control charts for measurement error models.

Vasyl Golosnoy1, Benno Hildebrandt1, Steffen Köhler1

  • 1Faculty of Management and Economics, Ruhr University Bochum, Universitätsstrasse 150, 44801 Bochum, Germany.

Advances in Statistical Analysis : Asta : a Journal of the German Statistical Society
|October 10, 2022
PubMed
Summary
This summary is machine-generated.

This study introduces control charts to monitor changes in measurement error models (MEMs). These tools detect shifts between AR(1) and ARMA(1,1) processes, crucial for accurate statistical analysis.

Keywords:
Control chartsMeasurement errorStatistical process controlVolatility modeling

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Area of Science:

  • Statistical Process Control
  • Time Series Analysis
  • Econometrics

Background:

  • Linear measurement error models (MEMs) with AR(1) processes are common in applied research.
  • These models can be represented as ARMA(1,1) processes, where the MA(1) parameter reflects measurement error variance.
  • Monitoring changes in the MA(1) parameter is vital for the integrity of these models.

Purpose of the Study:

  • To develop effective control charts for the online detection of changes in the MA(1) parameter of linear MEMs.
  • To identify shifts between AR(1) and ARMA(1,1) processes in real-time.
  • To assess the performance of proposed monitoring techniques.

Main Methods:

  • Development of cumulative sum (CUSUM) and exponentially weighted moving average (EWMA) control charts.
  • Utilizing Monte Carlo simulations to evaluate control chart performance.
  • Application to time series data of daily realized volatilities for empirical illustration.

Main Results:

  • The study successfully developed CUSUM and EWMA control charts for detecting parameter changes in MEMs.
  • Simulation results indicate the effectiveness of these charts in identifying shifts between AR(1) and ARMA(1,1) processes.
  • The empirical application demonstrates the practical utility of the proposed methods.

Conclusions:

  • The developed control charts provide valuable tools for online monitoring of linear measurement error models.
  • Timely detection of MA(1) parameter changes enhances the reliability of applied research using these models.
  • The approach is robust and applicable to financial time series data like realized volatilities.