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Method of high-precision spatial distance measurement based on optical-carried microwave interference
Optics Express
|October 12, 2022
Summary
This study introduces a novel high-precision spatial distance measurement method using optical carrier-based microwave interferometry (OCMI). The technique achieves accurate long-distance measurements, overcoming limitations of current equipment for scientific and industrial applications.
Area of Science:
- Metrology and Measurement Science
- Optical Physics
- Microwave Engineering
Background:
- High-precision spatial ranging is crucial for scientific research and industry.
- Existing equipment struggles to simultaneously achieve high speed, precision, and long-distance measurement capabilities.
- Optical carrier-based microwave interferometry (OCMI) offers a promising avenue for advanced metrology.
Purpose of the Study:
- To develop and demonstrate a novel method for high-precision spatial distance measurement.
- To overcome the limitations of current technologies in achieving simultaneous high speed, precision, and long-distance measurement.
- To leverage OCMI principles for robust and versatile distance determination.
Main Methods:
- A microwave-modulated broadband optical signal is transmitted through an interferometer with a free-space optical echo receiving system.
- Distance is resolved by scanning microwave frequencies and analyzing the resulting interferogram.
- Interference spectrum processing in the microwave domain ensures insensitivity to optical waveguide types and polarization states.
Main Results:
- The proposed method demonstrates high precision in spatial distance measurement.
- Experimental results show a root mean square error (RMSE) of 0.016 µm at 0.5 m and 0.023 µm within a 1 m distance over ten repeated measurements.
- The system effectively represents length measuring capabilities for practical applications.
Conclusions:
- The developed OCMI-based method offers a significant advancement in high-precision spatial ranging.
- The technique's insensitivity to optical properties and demonstrated accuracy validate its potential for scientific and industrial use.
- This approach provides a robust solution for simultaneous high-speed, high-precision, and long-distance measurements.
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