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Related Concept Videos

Measurements of Strain01:27

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Strain quantifies the deformation of a material under force, typically measured as normal strain, which represents the change in length when compared with the original length. Electrical strain gauges are used for enhanced accuracy. These devices consist of a conductive wire mounted on a paper backing that adheres to the material's surface. These gauges operate on the piezoresistive effect, where the wire's electrical resistance changes in response to mechanical deformation. The strain...
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Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
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Updated: Aug 26, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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Miniaturizing a Chip-Scale Spectrometer Using Local Strain Engineering and Total-Variation Regularized

Tuba Sarwar1, Can Yaras1, Xiang Li1

  • 1Department of Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Avenue, Ann Arbor, Michigan48109-2122, United States.

Nano Letters
|October 12, 2022
PubMed
Summary
This summary is machine-generated.

A novel chip-scale spectrometer for wearables was developed using strain-engineered InGaN/GaN quantum wells. This compact device achieves accurate spectral reconstruction for portable sensing applications.

Keywords:
Gallium nitridecompound semiconductorslight-emitting diodephotodetectionsapphire

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Area of Science:

  • Materials Science
  • Optoelectronics
  • Nanotechnology

Background:

  • Miniaturized spectrometers are crucial for portable and wearable sensing technologies.
  • Existing spectrometers often lack the required size, power, or cost-efficiency for widespread wearable integration.

Purpose of the Study:

  • To demonstrate a wafer-thin, chip-scale portable spectrometer for wearable applications.
  • To develop a spectrometer based on a reconstructive algorithm utilizing monolithically integrated spectral encoders.

Main Methods:

  • Monolithic integration of 16 spectral encoders/photodetectors on a 0.16 mm² chip using local strain engineering in InGaN/GaN multiple quantum wells.
  • Utilizing a built-in GaN pn junction for direct photocurrent measurement.
  • Employing a non-negative least-squares (NNLS) algorithm with total-variation regularization and a specific kernel function for spectral reconstruction.

Main Results:

  • Demonstrated spectral reconstruction in the 400-645 nm wavelength range.
  • Achieved high accuracy in spectral peak position (0.97%) and intensity ratios (10.4%).
  • Enabled angle-insensitive light harvesting and eliminated the need for external optics through integrated structures.

Conclusions:

  • A functional chip-scale spectrometer suitable for wearable devices has been successfully demonstrated.
  • The developed spectrometer offers a compact, efficient solution for portable spectral analysis.
  • Strain engineering and reconstructive algorithms are effective for miniaturized spectrometer design.