Measurements of Strain
Electron Microscope Tomography and Single-particle Reconstruction
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Updated: Aug 26, 2025

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Tuba Sarwar1, Can Yaras1, Xiang Li1
1Department of Electrical Engineering and Computer Science, University of Michigan, 1301 Beal Avenue, Ann Arbor, Michigan48109-2122, United States.
A novel chip-scale spectrometer for wearables was developed using strain-engineered InGaN/GaN quantum wells. This compact device achieves accurate spectral reconstruction for portable sensing applications.
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