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Self-referenced interferometry for single-shot detection of vector-vortex beams.

Praveen Kumar1,2, Naveen K Nishchal3, Takashige Omatsu1,2

  • 1Graduate School of Science and Engineering, Chiba University, Chiba, 263-8522, Japan.

Scientific Reports
|October 14, 2022
PubMed
Summary

This study introduces a rapid method for characterizing vector-vortex (VV) beams using self-referenced interferometry. The technique enables single-shot detection and parameter identification, even for high-order optical vortices.

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Area of Science:

  • Optics and Photonics
  • Laser Physics

Background:

  • Vector-vortex (VV) beams are crucial for advanced optical applications.
  • Accurate characterization of VV beams is essential but challenging.
  • Existing polarimetric methods require multiple measurements, limiting speed.

Purpose of the Study:

  • To develop a fast and efficient method for VV beam characterization.
  • To enable single-interferogram detection and parameter identification.
  • To extend characterization capabilities to high-order optical vortices.

Main Methods:

  • Utilizing self-referenced interferometry for beam analysis.
  • Employing a single interferogram for data acquisition.
  • Developing algorithms to extract beam parameters from the interferogram.

Main Results:

  • Demonstrated a novel technique for rapid VV beam detection.
  • Successfully identified VV beam parameters from a single interferogram.
  • Validated the method for detecting high-order optical vortices.

Conclusions:

  • Self-referenced interferometry offers a significant advancement in VV beam characterization.
  • The proposed method provides a fast, efficient, and versatile approach.
  • This technique facilitates broader applications of VV beams.