HTD2: a single-crystal X-ray diffractometer for combined high-pressure/low-temperature experiments at laboratory...

Area of Science:

• Materials Science
• Crystallography
• Physical Chemistry

Background:

• High-pressure (HP) and low-temperature (LT) X-ray diffraction experiments demand specialized equipment and techniques, particularly for cryogenic temperatures below 80 K.
• Studying subtle structural changes in pressure-temperature (p-T) phase diagrams requires single-crystalline samples and extreme LT/HP conditions, typically necessitating synchrotron facilities.

Purpose of the Study:

• To describe the design of a novel LT/HP diffractometer (HTD2) for single-crystal X-ray diffraction.
• To enable experiments using a laboratory X-ray source under extreme conditions.

Main Methods:

• Development of a dedicated LT/HP diffractometer (HTD2).
• Implementation of non-standard sample environments and measurement strategies for cryogenic temperatures (2-400 K) and high pressures (up to 20 GPa).

Main Results:

• The HTD2 instrument facilitates single-crystal X-ray diffraction experiments at temperatures between 2 K and 400 K and pressures up to 20 GPa.
• The design allows for detailed investigation of subtle structural changes in the p-T phase diagram.

Conclusions:

• The developed LT/HP diffractometer provides a laboratory-based solution for advanced single-crystal X-ray diffraction studies under extreme conditions.
• This instrument expands the accessibility of research into material phase diagrams at cryogenic temperatures and high pressures.