Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

X-ray Imaging01:24

X-ray Imaging

5.9K
German physicist Wilhelm Röntgen (1845–1923) was experimenting with electrical current when he discovered that a mysterious and invisible "ray" would pass through his flesh but leave an outline of his bones on a screen coated with a metal compound. In 1895, Röntgen made the first durable record of the internal parts of a living human: an "X-ray" image (as it came to be called) of his wife’s hand. Scientists worldwide quickly began their own experiments with...
5.9K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Ångström-Scale-Channel Iontronic Memristors for Neuromorphic Computing.

ACS applied materials & interfaces·2025
Same author

Acquired semi-squamatization during chemotherapy suggests differentiation as a therapeutic strategy for bladder cancer.

Cancer cell·2025
Same author

Exosomes delivering miR-129-5p combined with sorafenib ameliorate hepatocellular carcinoma progression via the KCTD1/HIF-1α/VEGF pathway.

Cellular oncology (Dordrecht, Netherlands)·2025
Same author

FaNAC047-FaNAC058 module coordinately promotes chlorophyll degradation and reactive oxygen species production during heat-induced leaf senescence in tall fescue.

Journal of integrative plant biology·2025
Same author

Improvement of GaN-Based Device Performance by Plasma-Enhanced Chemical Vapor Deposition (PECVD) Directly Preparing h-BN with Excellent Thermal Management Characteristics.

Molecules (Basel, Switzerland)·2025
Same author

Large scale submarine groundwater discharge dominates nutrient inputs to China's coast.

Nature communications·2025

Related Experiment Video

Updated: Aug 25, 2025

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on: May 28, 2016

13.9K

Automatic detection method for BGA defects based on x-ray imaging.

Kai Xiao, Qin Li, Yang Chen

    Applied Optics
    |October 18, 2022
    PubMed
    Summary

    This study introduces an automated X-ray imaging method for detecting Ball Grid Array (BGA) defects in complex integrated circuits. The novel approach effectively identifies subtle and edge defects, improving quality inspection.

    Area of Science:

    • Materials Science
    • Electrical Engineering
    • Computer Vision

    Background:

    • Ball Grid Array (BGA) packaging is crucial for high-density integrated circuits.
    • Increasing IC complexity poses challenges for BGA defect inspection and precise defect localization.
    • Existing inspection methods struggle with the intricate nature of modern BGA devices.

    Purpose of the Study:

    • To develop an automated detection method for Ball Grid Array (BGA) defects using X-ray imaging.
    • To address the challenges in precise defect localization within complex BGA assemblies.
    • To enhance the accuracy and efficiency of quality inspection for BGA packaging.

    Main Methods:

    • Utilized X-ray imaging for non-destructive detection of BGA areas.
    • Developed a defect detection algorithm incorporating threshold separation, detection filling, and closing operations.

    More Related Videos

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    10.2K
    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
    11:34

    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

    Published on: May 15, 2017

    11.2K

    Related Experiment Videos

    Last Updated: Aug 25, 2025

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
    11:14

    Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

    Published on: May 28, 2016

    13.9K
    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages
    08:46

    Using Synchrotron Radiation Microtomography to Investigate Multi-scale Three-dimensional Microelectronic Packages

    Published on: April 13, 2016

    10.2K
    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography
    11:34

    Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography

    Published on: May 15, 2017

    11.2K
  • Conducted comparative experiments with simulated and real data for validation.

    • Main Results:

    • The proposed method achieved automatic detection of BGA defects.
    • Experimental results demonstrated the method's effectiveness and robust performance.
    • The approach showed particular success in precisely identifying BGA edge and subtle defects.

    Conclusions:

    • The developed X-ray imaging-based method is an effective solution for automatic BGA defect detection.
    • The algorithm successfully addresses the challenges of precise defect localization in complex devices.
    • This technique offers a significant improvement for quality inspection in BGA packaging.