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A Defect Detection Model for Industrial Products Based on Attention and Knowledge Distillation
Ze-Kai Zhang1, Ming-Le Zhou1, Rui Shao1
1Shandong Computer Science Center, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250013, China.
This study introduces novel deep learning models, T-model and S-model, for industrial quality detection. These models enhance accuracy by integrating swin-transformer with convolutions and attention mechanisms for improved defect identification.
Area of Science:
- Computer Vision
- Machine Learning
- Industrial Automation
Background:
- Industrial quality detection is crucial in manufacturing, leveraging technologies like big data, IoT, and edge computing.
- Existing deep learning object detection methods face challenges in specialized industrial scenarios.
- There is a need for robust industrial detection algorithms compatible with IoT and edge computing.
Purpose of the Study:
- To address the limitations of current deep learning methods in industrial quality detection.
- To propose novel isomorphic industrial detection models (T-model and S-model).
- To enhance feature fusion and detection accuracy for industrial defect identification.
Main Methods:
- Designed two isomorphic industrial detection models: T-model and S-model.
- Integrated swin-transformer with convolution in the backbone, incorporating a residual fusion path.
- Developed a dual attention module in the neck for improved feature fusion.
- Implemented a knowledge distiller for the lightweight S-model to boost detection accuracy.
Main Results:
- Experimental validation on four public industrial defect detection datasets.
- Demonstrated superior performance of the proposed models in industrial defect detection tasks.
- The T-model and S-model showed significant advantages over existing methods.
Conclusions:
- The developed T-model and S-model offer effective solutions for industrial quality detection.
- The integration of swin-transformer, attention mechanisms, and knowledge distillation enhances detection accuracy.
- The proposed models are well-suited for industrial applications, particularly in defect detection.
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