A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources.

Area of Science:

• Synchrotron Radiation and X-ray Optics
• Particle Accelerator Physics

Background:

• Advancements in low-emittance synchrotron X-ray sources and free-electron lasers necessitate sophisticated diagnostic tools.
• Accurate measurement of spatial source properties, particularly source size, is critical for optimizing these advanced light sources.

Purpose of the Study:

• To introduce and validate a novel X-ray beam property analyzer.
• To enable simultaneous, high-sensitivity characterization of X-ray source size, divergence, position, and angle.
• To provide a versatile tool for monitoring both X-ray and electron source properties.

Main Methods:

• Development of an X-ray beam property analyzer utilizing a multi-crystal diffraction geometry.
• Incorporation of a crystal-based monochromator and a Laue crystal in a dispersive setting.
• Measurement of flat beam and transmitted beam profiles for comprehensive characterization.

Main Results:

• Theoretical modeling predicted the system's feasibility as a versatile characterization tool.
• Experimental validation at the Swiss Light Source demonstrated high sensitivity.
• Achieved a measurement sensitivity of less than 10% for a source size of approximately 12 µm.

Conclusions:

• The proposed multi-crystal diffraction system is a feasible and effective tool for X-ray source characterization.
• The system offers a compact setup with simple X-ray optics.
• The analyzer can be utilized for real-time monitoring of X-ray and electron source properties.