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M-STAR: Magnetism second target advanced reflectometer at the Spallation Neutron Source
Valeria Lauter1, Kang Wang2, Tim Mewes3
1Neutron Scattering Division, Neutron Sciences Directorate, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37831, USA.
The Review of Scientific Instruments
|November 1, 2022
Summary
M-STAR is a new polarized neutron reflectometer enabling advanced nanoscience and spintronics research. It offers high-resolution studies on small, atomically thin samples with in situ field and temperature control.
Area of Science:
- Materials Science and Engineering
- Condensed Matter Physics
- Nanoscience and Nanotechnology
Background:
- Next-generation neutron reflectometry is crucial for characterizing complex nanostructures.
- Existing techniques face limitations in sample size and probing capabilities for buried interfaces.
Purpose of the Study:
- To introduce M-STAR, a novel polarized neutron reflectometer with enhanced capabilities for nanoscience and spintronics.
- To enable routine studies on millimeter-sized, atomically thin samples under various in situ conditions.
- To expand the accessible range of wavevector transfer (Q) for advanced scattering measurements.
Main Methods:
- Utilizes a new focusing guide concept for small sample optimization.
- Incorporates a hybrid pulse-skipping chopper for constant geometry experiments.
- Enables specular, off-specular, grazing incidence small-angle neutron scattering (GISANS), and grazing incidence diffraction (GID).
Main Results:
- Optimized for samples as small as 2x2 mm², enabling studies on atomic-scale thicknesses.
- Provides a broad Q range (up to 0.3 Å⁻¹) for versatile measurements.
- Facilitates in situ application of magnetic/electric fields, light, and temperature.
- Offers improved GID for probing out-of-plane magnetic moments and in-plane structures.
- Introduces inelastic grazing incidence scattering for near-surface dynamics.
Conclusions:
- M-STAR significantly advances capabilities in polarized neutron reflectometry.
- It empowers routine high-resolution studies on challenging nanosystems and device-like structures.
- The instrument is positioned to lead in high-resolution polarized reflectometry and related surface/interface studies.
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