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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Aug 23, 2025

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Hybrid mode atomic force microscopy of phase modulation and frequency modulation.

Tatsuya Yamamoto¹, Masato Miyazaki¹, Hikaru Nomura²

¹Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.

Microscopy (Oxford, England)

|November 2, 2022

Summary

We introduce a hybrid phase modulation (PM)/frequency modulation (FM) atomic force microscopy (AFM) technique to significantly boost imaging speed in high-Q environments. This novel AFM operation mode shows great promise for faster nanoscale imaging applications.

Keywords:

atomic force microscopy frequency modulation hybrid mode phase modulation

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Area of Science:

Surface Science
Nanotechnology
Microscopy

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale imaging.
High-Q environments present challenges for traditional AFM imaging speed.
Existing AFM modes have limitations in achieving high-speed imaging.

Purpose of the Study:

To propose and investigate a hybrid phase modulation (PM)/frequency modulation (FM) AFM technique.
To enhance the imaging speed of AFM, particularly in high-Q environments.
To establish the relationship between phase shift, frequency shift, and tip-sample interaction forces.

Main Methods:

Derivation of the relationship between phase shift, frequency shift, and tip-sample interaction force.
Utilizing the equation of motion for the cantilever in high-Q environments.
Developing a hybrid PM/FM-AFM operation mode.

Main Results:

Established a theoretical framework for hybrid PM/FM-AFM.
Demonstrated that the tip-sample conservative force can be approximated by combining PM and FM contributions.
Preliminary results indicate a significant increase in imaging speed is achievable.

Conclusions:

Hybrid PM/FM-AFM is a novel and promising AFM operation mode.
This technique offers a pathway to overcome speed limitations in AFM imaging.
The method is particularly effective in high-Q environments.