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In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
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A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design

Aibin Yan1, Shaojie Wei1, Yu Chen1

  • 1School of Computer Science and Technology, Anhui University, Hefei 230601, China.

Micromachines
|November 11, 2022
PubMed

Keywords:
circuit reliabilitylatch designnon-volatileresistive random-access memorysingle-event upset

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