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Updated: Aug 22, 2025

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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    This study introduces a novel X-ray phase retrieval method to eliminate artifacts caused by rapid object changes in non-destructive testing. The technique significantly reduces phase retrieval errors, enhancing imaging accuracy for materials like carbon fiber.

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    Area of Science:

    • Physics
    • Materials Science
    • Non-Destructive Testing

    Background:

    • X-ray grating-based phase retrieval can produce artifacts with objects exhibiting rapid spatial transitions.
    • These artifacts are particularly problematic in non-destructive testing and evaluation (NDT&E) applications.
    • Existing methods struggle to accurately reconstruct phase information for complex material structures.

    Purpose of the Study:

    • To develop and demonstrate a method for artifact reduction in X-ray phase retrieval.
    • To improve the accuracy of phase imaging for objects with abrupt intensity variations.
    • To enhance the reliability of non-destructive testing using X-ray phase contrast imaging.

    Main Methods:

    • A novel phase retrieval method was developed, incorporating an interferogram corrected for object intensity variations.
    • The method was applied to X-ray microtomography data of a carbon fiber specimen using a single 2D grating.
    • Artifact reduction was quantified using the Confidence Map tool, which analyzes phase gradient information.

    Main Results:

    • The proposed method significantly reduced artifacts in X-ray phase retrieval, achieving a reduction factor greater than 10.
    • Experimental validation on a carbon fiber specimen demonstrated the effectiveness of the artifact correction.
    • The Confidence Map tool provided reliable error distribution estimation for quantitative evaluation.

    Conclusions:

    • The developed method effectively prevents artifacts in X-ray phase retrieval for objects with fast spatial transitions.
    • This technique offers a substantial improvement for non-destructive testing and evaluation applications requiring accurate phase imaging.
    • The integration of intensity correction and advanced error analysis tools enhances the robustness of X-ray phase contrast imaging.