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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
Bipasha Pal1, Arvind Kumar Gupta1
1Department of Mathematics, Indian Institute of Technology Ropar, Rupnagar 140001, Punjab, India.
This study explores transport processes using a model with a dynamic defect particle. The defect influences particle flow, leading to distinct system phases and revealing how particle constraints impact behavior.
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