Defect-Induced Ultrafast Nonadiabatic Electron-Hole Recombination Process in PtSe2 Monolayer

Hongfu Huang1, Junhao Peng1, Zixuan Li1

  • 1School of Physics and Optoelectronic Engineering, Guangdong University of Technology, Guangzhou510006, China.

Summary

Native point defects in platinum diselenide (PtSe2) monolayers significantly accelerate electron-hole recombination. This defect-induced non-radiative transition explains the slow response in PtSe2-based photodetectors.