Overview of Microscopy Techniques
Atomic Force Microscopy
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Updated: Aug 19, 2025

Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
Published on: June 13, 2023
R Sakuma1, Y Nagai1, H Nakajima1
1Department of Precision Engineering, The University of Tokyo, Bunkyo-ku, Tokyo 113-8654, Japan.
This study introduces a dual-probe scattering-type scanning near-field optical microscopy (s-SNOM) system for precise nanoscale measurements. The new system enables simultaneous, multiposition near-field analysis of heat and carrier dynamics.
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