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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
An experimental framework for assessing the detective quantum efficiency of spectroscopic x-ray detectors
Nikta Zarif Yussefian1, Jesse Tanguay1
1Department of Physics, Toronto Metropolitan University, Toronto, ON, Canada.
Background:
Assessing the performance of spectroscopic x-ray detectors (SXDs) requires measurement of the frequency-dependent detective quantum efficiency (DQE). Analytical expressions of the task-based DQE and task-independent DQE of SXDs have been presented in the literature, but standardizable experimental methods for measuring them have not. The task-based DQE quantifies the efficiency with which an SXD uses the x-ray quanta incident upon it to either quantify or detect a basis material (e.g., soft tissue or bone) of interest. The task-independent DQE is akin to the conventional DQE in that it is independent of the basis material to be detected or quantified.
Purpose:
The purpose of this paper is to develop an experimental framework to present a method for experimental analysis of the DQE of SXDs, including the task-based DQE and task-independent DQE.
Methods:
We develop methods to measure the frequency-dependent DQE for task of quantifying or detecting a perturbation in a known basis material. We also develop methods for measuring a task-independent DQE. We show that the task-based DQEs and the task-independent DQE can be measured using a modest extension of the methods prescribed by International Electrotechnical Commission (IEC). Specifically, measuring the task-independent DQE requires measuring the modulation transfer function (MTF) and noise power spectrum (NPS) of each energy-bin image, in addition to the cross NPS between energy-bin images. Measuring the task-based DQEs requires an additional measurement of the transmission fraction through a thin basis-material absorber. We implemented the developed methods using standardized IEC x-ray spectra, aluminum (Al) and polymethyl methacrylyte (PMMA) basis materials, and a cadmium telluride (CdTe) SXD equipped with two energy bins and analog charge summing (ACS) for charge-sharing suppression. We also performed a regression analysis to determine whether or not the task-independent DQE is predictive of the task-based DQEs.
Results:
Experimental results of the task-based DQEs were consistent with simulation results presented in the literature. In general, and as expected, ACS increased the task-based DQEs and task-independent DQE. This effect was most pronounced for quantification tasks, in some instances yielding a five-fold increase in the DQE. For both spectra, with and without ACS for charge sharing correction, the task-based DQEs were linearly related to the task-independent DQE, as demonstrated by R2 -values ranging from 0.89 to 1.00.
Conclusions:
We have extended experimental DQE analysis to SXDs that count photons in multiple energy bins in a single x-ray exposure. The developed framework is an extension of existing IEC methods, and provides a standardized approach to assessing the performance of SXDs.
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