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Measurement of Scattering Nonlinearities from a Single Plasmonic Nanoparticle
Published on: January 3, 2016
Dual-Wavelength Forward-Enhanced Directional Scattering and Second Harmonic Enhancement in Open-Hole Silicon
Xinghua Wang1, Yunbao Zheng2, Min Ouyang1
1Guangdong Provincial Key Laboratory of Nanophotonic Functional Materials and Devices, School for Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510006, China.
Abstract:
Nanostructures with appropriate sizes can limit light-matter interaction and support electromagnetic multipole resonance. The interaction between light and nanostructures is intimately related to manipulating the direction of scattered light in the far field as well as the electromagnetic field in the near field. In this paper, we demonstrate dual-wavelength directional forward-scattering enhancement in an individual open-hole silicon nanoblock (OH-SiNB) and simultaneously achieve bulk and surface electromagnetic field localization. The second harmonic generation is enhanced using electromagnetic field localization on the square hole surface. Numerical simulations reveal that the resonance modes, at λ1 = 800 nm and λ2 = 1190 nm, approximately satisfy the Kerker condition. In the near field, the magnetic dipole modes at dual wavelength all satisfy the boundary condition that the normal component of the electric displacement is continuous on the square holes surface, thus obtaining the surface electromagnetic field localization. Moreover, highly efficient second harmonic generation can be achieved at dual wavelengths using the surface electromagnetic field localization and the increased surface area of the square holes. Our results provide a new strategy for the integration of nanoantennas and nonlinear optoelectronic devices in optical chips.

