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    Area of Science:

    • Optical Physics
    • Metrology
    • Materials Science

    Background:

    • Optical characterization methods struggle with phase ambiguity due to scattering and absorption.
    • Measuring complex optical fields is crucial for high-resolution imaging.

    Purpose of the Study:

    • To develop a novel topography measurement technique for thick samples.
    • To overcome limitations of existing phase measurement methods.
    • To encode complete optical field information into polarization states.

    Main Methods:

    • Developed a method encoding complete optical field information into polarization states.
    • Utilized a wedged cuvette to vary ambient refractive index blindly.
    • Simultaneously measured sample thickness and ambient refractive index in real-time.

    Main Results:

    • Successfully measured the topography of a 136.7 µm thick coverslip.
    • Achieved the thickest sample characterization to date using quantitative phase imaging.
    • Demonstrated blind variation of ambient refractive index by 0.001246.

    Conclusions:

    • The developed method offers efficient and complete optical field characterization.
    • This technique extends the measurement range for sample thickness.
    • The method shows promise for applications in microscopy, remote sensing, and biological tissue topography.