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Worst-Case X-ray Photon Energies in Ultrashort Pulse Laser Processing.

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Exceeding critical laser irradiance during ultrashort pulse laser processing generates unwanted X-rays. Burst mode laser processing significantly increases X-ray dose rates and photon energies, with a maximum observed energy of 40 keV.

Keywords:
X-ray dose rateX-ray emissionX-ray energiesX-ray spectrumradiation protectionultrashort pulsed laser

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Area of Science:

  • Materials Science
  • Laser Physics
  • Radiation Physics

Background:

  • Ultrashort pulse laser processing can generate secondary X-ray emissions when laser irradiance exceeds 10^13 W cm^-2.
  • Understanding these X-ray emissions is crucial for safety and process control in laser material processing.

Purpose of the Study:

  • To investigate spectral X-ray emissions during ultrashort pulse laser processing of tungsten and steel.
  • To determine maximum X-ray photon energies and calculate dose equivalent rates under various laser conditions.

Main Methods:

  • Utilized three complementary spectrometers (CdTe and silicon drift detectors) for simultaneous X-ray spectral analysis.
  • Employed an ultrashort pulse laser workstation with controlled parameters (274 fs pulse duration, 1030 nm wavelength, 50-200 kHz repetition rates, 33 μm spot diameter).
  • Operated in single pulse and burst laser modes, varying pulse energy and repetition rate at constant average power (approx. 20 W).

Main Results:

  • Peak irradiances ranged from 7.3 × 10^13 W cm^-2 to 3.0 × 10^14 W cm^-2.
  • X-ray dose equivalent rate increased with lower repetition rates and higher pulse energy at constant average power.
  • Burst mode laser processing significantly elevated dose rates and X-ray photon energies.
  • A maximum X-ray photon energy of approximately 40 keV was recorded during burst mode processing of tungsten at 50 kHz repetition rate and 3 × 10^14 W cm^-2 peak irradiance.

Conclusions:

  • Laser irradiance thresholds for X-ray generation in ultrashort pulse laser processing were confirmed.
  • Burst mode operation presents a higher risk due to increased X-ray dose rates and energies.
  • Characterization of X-ray emissions is essential for safe implementation of high-power ultrashort pulse lasers.